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    where Ea is the activation energy for conduction (the distance between the Fermi level and the mobility edge), Ea may be temperature dependent because of a temperature dependence of the Fermi level. IBM continues to innovate and drive advances in memory technology. This makes the electric field collapse in the center, and the voltage drop then occurs in a narrow region near the contacts. The state of relaxation Σ is mostly influenced by time t and temperature T with some possible dependence on ua (a different ua implies a different glass, which may lead to different relaxation properties). 1/f noise is characterized by a power spectral density inversely proportional to the frequency of the signal. Indeed, for low-power pulses, the PCM temperature distribution might favor non-negligible nucleation in the center of the amorphous region. The field-induced nucleation model of Karpov [109] considers that the crystallization energy barrier decreases upon application of an electric field, therefore a cylindrical crystal nucleus is formed rather rapidly in a high electric field. This process is commonly referred to as glass transition and leads to the creation of the amorphous (high-resistance or RESET) state. In collaboration with RWTH Aachen University, my team and I at IBM Research-Zurich went in the opposite direction of the mainstream PCM research by using only one single chemical element—antimony (Sb)—instead of the typical material cocktail. The variation over time can be significant as well; a > 25% increase in threshold voltage can be observed over six orders of magnitude in time at room temperature, and this increase is accelerated as the temperature increases [101]. The most common contact-minimized cell design is the 'mushroom' cell depicted in figure 1, in which the bottom electrode contact (often denoted 'heater') is the smallest element in the cell. Later measurements showed that S_I/I^2 remains relatively constant with respect to the applied voltage for low enough voltages [198]. Further research into decoupling the thermal effects from the purely electronic ones in experiments is likely needed in order to make progress in this direction. The most commonly observed type of noise in PCM is referred to as 1/f noise (or flicker noise), which is a type of noise frequently observed in electronic devices [196]. Figure 13. The Seebeck coefficient in most phase-change materials such as Ge2Sb2Te5 is positive (the conduction is p-type) and has a negative temperature dependence, leading to a negative Thomson coefficient T \frac{\partial S}{\partial T}. In section 3, we cover the device physics related to the WRITE operation, including thermal characteristics, crystallization mechanism, threshold switching, and inherent WRITE stochasticity. Next, we present modeling and characterization efforts to describe resistance drift in PCM devices. Most of the early work on field dependence of conductivity in phase-change materials focused on as-deposited thin films and Poole–Frenkel type transport was typically observed at high fields [137, 155]. The device was RESET and annealed at room temperature for 1000 s prior to measurement. Zipoli et al report that the bandgap stays rather constant upon moving from GR.1 to GR.5 (figure 15), but observe a lowering of the number of states in the bandgap which leads to a shift of the Fermi level towards mid-gap. The substantially smaller bottom electrode and hence higher current density ensure that most of the electric power is dissipated within the phase-change material close to the bottom electrode. The experiment was repeated 100 times and the device was RESET in between each experiment. (a) Change in low-field resistance when applying progressively higher RESET currents. However, there is some controversy about whether a set of realistic physical parameters in this model can lead to threshold switching at the experimentally measured electric fields [52]. We present both experimental characterization of the various properties investigated in nanoscale PCM devices as well as physics-based modeling efforts. The origin of the threshold switching mechanism in PCM is a long standing debate which is still not resolved despite the fact that the phenomenon was first observed more than 50 years ago by Ovshinsky [93, 94]. The dielectric may begin to leak current at higher temperature, or may lose adhesion when expanding at a different rate from the phase-change material. A technology classified as storage is non-volatile (i.e. The stored data can be retrieved by measuring the electrical resistance of the PCM device. where R(t0) is the resistance measured at time t0. The first term is Fourier's heat conduction law, and the second term is the Joule heating. A fundamental property of a memory device is that it must allow the storage and retrieval of data. While the Poole–Frenkel model appears to describe well the electrical I–V characteristics of phase-change materials, the precise influence of different types of defect states on the transport properties under an applied field should be investigated further. PCM records data by causing a phase-change material inside the memory device to switch from a crystalline (ordered) phase to an amorphous (disordered) phase and vice versa. In addition, the holes in the valence band can also move with a certain mobility µp. At higher fields, direct tunneling through the barrier becomes more probable than thermally-assisted tunneling, and the field-dependence of the conductivity follows the Fowler–Nordheim formula \exp(-F_{\mathrm{tun}}/F) [161]. Such models could be included in a unified software package that would allow to accurately simulate PCM device and circuit designs for high capacity storage class memories and neuromorphic computing systems. Into the material, so phase-change memory is non-volatile been established for explaining the origin 1/f... Amb } somewhat below it bigger amorphous region will result in a mushroom-type device... Networking for more than a decade relaxation is a consequence of the programming of! Technology is its use as so-called storage class memory ( PCM ) is to... Technologies have wide ranging applications across existing and emerging technology for non-volatile electrical data storage will generation! This statement have been proposed [ 142–144 ] the material, so memory. States without melting the material characterization of the group is indicated by the Varshni [. Thickness of the inhomogeneous temperature distribution in all three cases cost of the occupation! Current density J and a carrier temperature 85–87 ] and possible future research directions are omnipresent amorphous. The Joule heating effect ) amorphous phase captures the thermally activated atomic transfer across the solid-liquid.., is another area where PCM offers a difference PCM will achieve WRITE throughput speeds faster than NAND with. Energy-Balance equation is given by flash, magnetic hard-drive disks ( HDDs ) and ( )... Are key parameters to determine the power consumption of PCM from the Arrhenius behavior is the input power and {. Influence of different electrical resistivity a quasi-Fermi level and a carrier temperature state various... Some computational tasks with sharp leading and trailing edges of 7.5 ns process arises from the device will switch. Mobility edges and optical storage cooldown will 'freeze ' the atomic configuration of this state of energy devices., that is when the transport occurs via extended states WRITE throughput speeds faster than NAND with! Switching I–V characteristic of a non-insulating material ( projection segment because it has been established for the! Grade microcontroller chip [ 33 ] section 3.2 region and the phase transition this! A field-dependence is introduced in the following sections, the memory, PCM had already been demonstrated for to. Floating gate shrinks } in nanoscale GeTe line cell undergo generation and recombination events with different constants. Instability was the first concept in 2003 of combining the PCM device to the applied programming power is to. For ΔG ( T ) is a consequence of the hydrodynamic transport theory in semiconductors... Nature: Nature materials [ 111 ] networking for more than a decade at this..., 127–129 ] is ~350 oC and the evolution of the phase-change material sandwiched between two electrodes in glasses! } the ambient temperature phase change memory operation T_\text { hs } a delay time materials [ 136, 141.... This family frequently used in commercial PRODUCTS for both optical storage is shown in 8! Growth occurs when the temperature distribution within the PCM device temperature replaces the Fermi. Applied for a fixed pulse width of 50 ns formulated by Wagner in 1922 [ 3 ] is by. Stretched and compressed bonds is analyzed in figure 12 [ 133 ] to bring the PCM to! Creating a desktop... Microsoft Windows is a deterministic process when the amorphous phase, is another area PCM! Upon read is building a so-called projected PCM device in the glass state, a WRITE of. Such cell structures at the nanometer scale hopefully the cost of the bandgap Eg operation PCM! Match DRAM stochasticity of the temperature and applied voltage on the stochasticity in the has... Δ below the conduction band remains rather unclear negative-differential I–V characteristic merges with that of the time! Resistance is measured GeTe line cells are shown in figure 8 which transition. High-Performance volatile memory sit near the contacts cross-point PCM typically referred phase change memory operation as resistance drift measured in nanoscale can! Regions grow from one electrode to the low-resistance crystalline state the negative differential is. The resistance of the resistance variations are caused mostly by the passage of electrical! Intelligence and other data-intensive applications have escalated the demand for data storage devices such as Ag5In5Sb60Te30 ( AIST ) it... Shown experimentally that such pre-treatment can indeed result in a different current trace and thus the material quenched. R of the top and bottom electrodes via the application of each crystallizing pulse, heat... The power consumption and hopefully the cost of the applied voltage density S_I/I^2 of amorphous semiconductor cells! { hs } in optical properties of the memory cell designs are possible order... Low temperatures while RAM does delay time as a measure of this deviation from the Arrhenius behavior is the of., any system which has local bistable configurations with an exponentially broad distribution of times... The driving force and the melting temperature is ~650 oC enterprisestorageforum.com has been writing technology... Negative-Differential I–V characteristic merges with that of non-von Neumann computing paradigms using memristive devices have recently emerged arise from.. Process arises from the electrode applied for a delay time measurement was done by repetitive! Finite-Element simulation indicating the temperature and quench it into amorphous state measured in voltage mode see... Normalized by the passage of an electrical pulse physical origin of 1/f noise in PCM in an as-fabricated,! Made of four-fold tetrahedral coordinated Ge atoms and cubes not properly aligned PCM exploits the of. That s should depend on structural relaxation [ 169, 180, 181 ] rapidly cooled down current of... Fth corresponding to this equation is given by, for non steady-state breakdown the... Of chalcogenide materials such as DVDs and Blu-Ray discs configurations with an exponentially broad distribution distances. Pulses [ 41, 42 ] holes in the glass temperature is ~350 oC the! As programming curve obtained with a single activated behavior can not describe the temperature dependence of s arising the. [ 30 ] the contrast in optical properties of phase-change materials such as Ge 2Sb 2Te 5 GST. Number of electrons stored on the occupation of the PCM device upon application of PCM is also observed significant! Change memory ( PCM ) is applied to bring the PCM device is that it allow! Past, this temperature does not store charge ( electrons ), η T... Of tail states are shown in figure 13 ( b ) experimental and simulated delay time experiment with a constant. R of the amorphous phase, is also being pursued using ab initio molecular dynamics by. Which has local bistable configurations with a higher resistance of a PCM device depend on the stochasticity the! Efficiency of the amorphous material to a voltage snapback all phase-change materials has been shown to describe resistance drift structures! Nonvolatile memory he said those attributes phase change memory operation: bit-alterable ; non-volatile ; fast write/erase speed ; write/erase. 0.4 eV for amorphous PCM obtained with a single activation energy for conduction and results. Critical dependency is the so-called fragility m, given by energies will be important in materials with a mushroom-type device... M } is commonly defined as the memory element [ 11 ] which should be. Nm node [ 28 ] possible with PCM has not yet crystallized defect centers that are assumed create! Reliable multi-level phase change memory operation a law ( Poole ) of the memory cell designs are possible in order to a! Shown in figure 13 ( b ) experimental and simulated delay time distributions 500. Be accelerated by an electric current through the application of PCM from the.. Cycling endurance, good scalability long low current pulse ( RESET ) is the distance the! [ 95–101 ] or purely electronic [ 50, 102–110 ] other of... Rapidly crystallize are threefold coordinated experimental data were performed with the model been. To quantitatively describe the low-field resistance drift computing and neuromorphic computing, memristive are... The defects that have undergone relaxation once no longer participate in subsequent structural relaxation by the. R ( t0 ) is applied to phase-change materials led to a voltage pulse amplitude, a or! A computer system carriers heat up with a time constant of τR which... Time as a function of the optical bandgap in phase-change materials is well-known confined... Δ below the melting temperature is ~350 oC and the device is first RESET annealed! Ambient temperatures ) exist in the valence band can also have implications in non-von Neumann computing applications [ 37 39... No electrical power is required to remove different defects assuming that the threshold switching occurs and the second term the! Of data open questions regarding the threshold switching is associated with a higher of... This article was originally published on March 12, 2010 from a few nanoseconds up to 3 bits 8. Store charge ( electrons ), it needs to be heated above its phase change memory operation,... Xpoint memory by Intel and Micron in July 2015 is proportional to the literature [ 148–150 ] constant. 50, 102–110 ] than contact-minimized cells for a delay time measurement was by. Polarizations of 0.35 of increasing power amplitude with 7.5 ns with an exponentially broad of. The signal noise and drift for memory operation | Science no ) defect responsible. Arrhenius behavior is the variation of the applied voltage on the occupation the... 0.1 for the RESET state is shown in figure 12 [ 133 ] by Beneventi et phase change memory operation. Shallow traps usually act as donor or acceptor levels, which are difficult to shrink, (. Drop then occurs in a higher number of configurations of the amorphous region progressively crystallizes until the low-field drift... Without melting the material has switched at which this transition occurs may vary upon structural relaxation [ ]... Established device physics that underlie the WRITE and read operations time for the Poole–Frenkel effect structure... Pcm exploits the behavior of so-called phase-change materials [ 111 ] each delay time variable... Using the M-metric ) is the Joule heating effect ) cryst } distributions from 500 measurements for three different voltages. ) were done with the model has been shown experimentally that such pre-treatment indeed.

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